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125
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VTS
2008
IEEE
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VTS 2008
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Expanding Trace Buffer Observation Window for In-System Silicon Debug through Selective Capture
15 years 9 months ago
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users.ece.utexas.edu
Trace buffers are commonly used to capture data during in-system silicon debug. This paper exploits the fact that it is not necessary to capture error-free data in the trace buffe...
Joon-Sung Yang, Nur A. Touba
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