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89
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ITC
1998
IEEE
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ITC 1998
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Stimulus generation for built-in self-test of charge-pump phase-locked loops
15 years 7 months ago
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www.ece.mcgill.ca
Abstract - This paper addresses the issue of the stimulation of charge-pump phase-locked loops for built-in selftest applications. It is shown that three nodes of the PLL qualify f...
Benoît R. Veillette, Gordon W. Roberts
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