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105
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DATE
2003
IEEE
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DATE 2003
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Self-Testing Embedded Checkers for Bose-Lin, Bose, and a Class of Borden Codes
15 years 8 months ago
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—A new approach for designing t-UED and BUED code checkers is presented. In particular we consider Borden codes for t = 2k − 1, Bose and Bose-Lin codes. The design technique fo...
Steffen Tarnick
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