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108
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DFT
1998
IEEE
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VLSI
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DFT 1998
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Characterization of CMOS Defects using Transient Signal Analysis
15 years 7 months ago
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www.ece.unm.edu
We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
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