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132
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ASPDAC
2007
ACM
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ASPDAC 2007
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Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies
15 years 7 months ago
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www.cecs.uci.edu
- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Ch...
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