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100
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DDECS
2007
IEEE
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DDECS 2007
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March CRF: an Efficient Test for Complex Read Faults in SRAM Memories
15 years 9 months ago
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eprints.ecs.soton.ac.uk
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...
Luigi Dilillo, Bashir M. Al-Hashimi
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