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107
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ICCD
2002
IEEE
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ICCD 2002
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Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits
15 years 7 months ago
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cseweb.ucsd.edu
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
Sule Ozev, Alex Orailoglu
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