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118
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ICCD
2008
IEEE
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ICCD 2008
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Test-access mechanism optimization for core-based three-dimensional SOCs
16 years 5 days ago
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people.ee.duke.edu
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yua...
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