Sciweavers
Explore
Publications
Books
Software
Tutorials
Presentations
Lectures Notes
Datasets
Labs
Conferences
Community
Upcoming
Conferences
Top Ranked Papers
Most Viewed Conferences
Conferences by Acronym
Conferences by Subject
Conferences by Year
Tools
PDF Tools
Image Tools
Text Tools
OCR Tools
Symbol and Emoji Tools
On-screen Keyboard
Latex Math Equation to Image
Smart IPA Phonetic Keyboard
Community
Sciweavers
About
Terms of Use
Privacy Policy
Cookies
106
Voted
DAGM
2004
Springer
97
views
Image Processing
»
more
DAGM 2004
»
Using Pattern Recognition for Self-Localization in Semiconductor Manufacturing Systems
15 years 8 months ago
Download
www.cs.technion.ac.il
In this paper we present a new method for self-localization on wafers using geometric hashing. The proposed technique is robust to image changes induced by process variations, as o...
Michael Lifshits, Roman Goldenberg, Ehud Rivlin, M...
claim paper
Read More »