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DATE
2003
IEEE
99views Hardware» more  DATE 2003»
15 years 2 months ago
Fast Computation of Data Correlation Using BDDs
Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed...
Zhihong Zeng, Qiushuang Zhang, Ian G. Harris, Maci...