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127
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ISCAS
2007
IEEE
173
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ISCAS 2007
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Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
15 years 9 months ago
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— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
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