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105
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ICCD
2005
IEEE
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ICCD 2005
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Deployment of Better Than Worst-Case Design: Solutions and Needs
16 years 10 days ago
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www.eecs.umich.edu
The advent of nanometer feature sizes in silicon fabrication has triggered a number of new design challenges for computer designers. These challenges include design complexity and...
Todd M. Austin, Valeria Bertacco
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