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DFT
2002
IEEE
115views VLSI» more  DFT 2002»
15 years 1 months ago
Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
Sagar S. Sabade, D. M. H. Walker