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111
Voted
DFT
2007
IEEE
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VLSI
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DFT 2007
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Quantitative Analysis of In-Field Defects in Image Sensor Arrays
15 years 9 months ago
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euler.ecs.umass.edu
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...
Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israe...
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