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120
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ICCD
2008
IEEE
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ICCD 2008
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CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework
15 years 11 months ago
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www.eecs.umich.edu
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...
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