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138
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DDECS
2007
IEEE
201
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DDECS 2007
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Built in Defect Prognosis for Embedded Memories
15 years 9 months ago
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vlsi-india.org
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
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