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115
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ISCAS
2005
IEEE
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ISCAS 2005
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Built-in self-test for automatic analog frequency response measurement
15 years 8 months ago
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www.eng.auburn.edu
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...
Dayu Yang, Foster F. Dai, Charles E. Stroud
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