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117
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DATE
2002
IEEE
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DATE 2002
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A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits
15 years 8 months ago
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A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...
Michael Pronath, Helmut E. Graeb, Kurt Antreich
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