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131
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DFT
2003
IEEE
106
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VLSI
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DFT 2003
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Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits
15 years 8 months ago
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euler.ecs.umass.edu
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
Atul Maheshwari, Israel Koren, Wayne Burleson
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