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    CIARP
    2010
    Springer
    183views Pattern Recognition» more  CIARP 2010»
    On Improving Dissimilarity-Based Classifications Using a Statistical Similarity Measure
    14 years 7 months ago
    On Improving Dissimilarity-Based Classifications Using a Statistical Similarity Measure
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    The aim of this paper is to present a dissimilarity measure strategy by which a new philosophy for pattern classification pertaining to dissimilaritybased classifications (DBCs) ca...
    Sang-Woon Kim, Robert P. W. Duin
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