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78
Voted
ICIP
2008
IEEE
15 years 11 months ago
Automated line flattening of Atomic Force Microscopy images
In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bo...
Sotirios A. Tsaftaris, Jana Zujovic, Aggelos K. Ka...