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94
Voted
DAC
2006
ACM
16 years 18 days ago
Novel full-chip gridless routing considering double-via insertion
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures. To improve via yield and reliability, redundant-via insertion is a highl...
Huang-Yu Chen, Mei-Fang Chiang, Yao-Wen Chang, Lum...