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114
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ISCAS
2007
IEEE
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ISCAS 2007
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A Study on Impact of Leakage Current on Dynamic Power
15 years 9 months ago
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www-unix.ecs.umass.edu
— Scaling of CMOS technologies has led to dramatic increase in sub-threshold, gate and reverse biased junction band-to-band-tunneling (BTBT) leakage. Leakage current has now beco...
Ashesh Rastogi, Kunal P. Ganeshpure, Sandip Kundu
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