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ISCAS
2007
IEEE
92views Hardware» more  ISCAS 2007»
15 years 3 months ago
A Study on Impact of Leakage Current on Dynamic Power
— Scaling of CMOS technologies has led to dramatic increase in sub-threshold, gate and reverse biased junction band-to-band-tunneling (BTBT) leakage. Leakage current has now beco...
Ashesh Rastogi, Kunal P. Ganeshpure, Sandip Kundu