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ICASSP
2008
IEEE
15 years 3 months ago
Gradient steepness metrics using extended Baum-Welch transformations for universal pattern recognition tasks
In many pattern recognition tasks, given some input data and a family of models, the “best” model is defined as the one which maximizes the likelihood of the data given the m...
Tara N. Sainath, Dimitri Kanevsky, Bhuvana Ramabha...