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ET
1998
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ET 1998
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Scalable Test Generators for High-Speed Datapath Circuits
15 years 2 months ago
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www.ece.ucdavis.edu
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
Hussain Al-Asaad, John P. Hayes, Brian T. Murray
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