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107
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GLVLSI
2010
IEEE
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GLVLSI 2010
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Improving the testability and reliability of sequential circuits with invariant logic
15 years 7 months ago
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In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integr...
Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris...
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