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111
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DFT
2003
IEEE
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DFT 2003
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Partial Error Masking to Reduce Soft Error Failure Rate in Logic Circuits
15 years 8 months ago
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www.ece.rice.edu
A new methodology for designing logic circuits with partial error masking is described. The key idea is to exploit the asymmetric soft error susceptibility of nodes in a logic cir...
Kartik Mohanram, Nur A. Touba
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