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VLSID
2009
IEEE
87views VLSI» more  VLSID 2009»
15 years 10 months ago
Soft Error Rates with Inertial and Logical Masking
We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...
Fan Wang, Vishwani D. Agrawal