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    VLSID
    2009
    IEEE
    87views VLSI» more  VLSID 2009»
    Soft Error Rates with Inertial and Logical Masking
    16 years 26 days ago
    Soft Error Rates with Inertial and Logical Masking
    Download  www.eng.auburn.edu
    We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...
    Fan Wang, Vishwani D. Agrawal
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