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111
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ISQED
2006
IEEE
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ISQED 2006
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Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices
15 years 9 months ago
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www.see.ed.ac.uk
This paper presents a unique SEU (single Event Upset) mitigation technique based upon Temporal Data Sampling for synchronous circuits and configuration bit storage for programmabl...
Sajid Baloch, Tughrul Arslan, Adrian Stoica
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