242
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EVOW
2001
Springer
16 years 17 days ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
170
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EVOW
2001
Springer
16 years 17 days ago
2001
Springer
187
click to vote
EVOW
2001
Springer
16 years 17 days ago
2001
Springer
In this article we investigate the application of iterated local search (ILS) to the single machine total weighted tardiness problem. Our research is inspired by the recently propo...