Sciweavers

123
Voted
GLVLSI
2009
IEEE
125views VLSI» more  GLVLSI 2009»
15 years 10 months ago
Redundant wire insertion for yield improvement
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...
Jin-Tai Yan, Zhi-Wei Chen