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115
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ASPDAC
2010
ACM
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ASPDAC 2010
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A fast analog mismatch analysis by an incremental and stochastic trajectory piecewise linear macromodel
15 years 27 days ago
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To cope with an increasing complexity when analyzing analog mismatch in sub-90nm designs, this paper presents a fast non-MonteCarlo method to calculate mismatch in time domain. Th...
Hao Yu, Xuexin Liu, Hai Wang, Sheldon X.-D. Tan
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