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100
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DATE
2010
IEEE
145
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Hardware
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DATE 2010
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An evaluation of a slice fault aware tool chain
15 years 8 months ago
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www.ece.iastate.edu
Abstract—As FPGA sizes and densities grow, their manufacturing yields decrease. This work looks toward reclaiming some of this lost yield. Several previous works have suggested f...
Adwait Gupte, Phillip Jones
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