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110
Voted
IOLTS
2003
IEEE
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IOLTS 2003
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The positive effect on IC yield of embedded Fault Tolerance for SEUs
15 years 8 months ago
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Fault tolerant design is a technique emerging in Integrated Circuits (IC’s) to deal with the increasing error susceptibility (Soft Errors, or Single Event Upsets, SEU) caused by...
André K. Nieuwland, Richard P. Kleihorst
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