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131
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CP
1998
Springer
110
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Artificial Intelligence
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CP 1998
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Generation of Test Patterns for Differential Diagnosis of Digital Circuits
15 years 7 months ago
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ssdi.di.fct.unl.pt
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
Francisco Azevedo, Pedro Barahona
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