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29
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ICCAD
2002
IEEE
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ICCAD 2002
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Theoretical and practical validation of combined BEM/FEM substrate resistance modeling
14 years 7 months ago
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cas.et.tudelft.nl
In mixed-signal designs, substrate noise originating from the digital part can seriously influence the functionality of the analog part. As such, accurately modeling the properti...
Eelco Schrik, Patrick Dewilde, N. P. van der Meijs
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