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91
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VTS
1998
IEEE
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VTS 1998
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Experimental Results for IDDQ and VLV Testing
15 years 7 months ago
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www-crc.stanford.edu
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu,...
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