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ISQED
2007
IEEE
148views Hardware» more  ISQED 2007»
16 years 12 days ago
On Accelerating Soft-Error Detection by Targeted Pattern Generation
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
168
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IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
16 years 13 days ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu