Sciweavers
Explore
Publications
Books
Software
Tutorials
Presentations
Lectures Notes
Datasets
Labs
Conferences
Community
Upcoming
Conferences
Top Ranked Papers
Most Viewed Conferences
Conferences by Acronym
Conferences by Subject
Conferences by Year
Tools
PDF Tools
Image Tools
Text Tools
OCR Tools
Symbol and Emoji Tools
On-screen Keyboard
Latex Math Equation to Image
Smart IPA Phonetic Keyboard
Community
Sciweavers
About
Terms of Use
Privacy Policy
Cookies
105
click to vote
ISCAS
2002
IEEE
94
views
Hardware
»
more
ISCAS 2002
»
Modeling hot-electrons effects in silicon-on-sapphire MOSFETs
15 years 8 months ago
Download
www.eng.yale.edu
A unified, closed form analytical drain current model for partially and fully depleted SOS MOSFETs was investigated. The analytical model was developed using first order principle...
Eugenio Culurciello, Andreas G. Andreou, Philippe ...
claim paper
Read More »