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121
Voted
ICPR
2000
IEEE
118
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computer vision
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ICPR 2000
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Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis
16 years 3 months ago
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repository.tudelft.nl
Micromachined picoliter vials in silicon dioxide with a typical depth of 6.0?m are filled with a liquid sample. Epiilluminated microscopic imaging during evaporation of the liquid...
L. R. Van den Doel, Lucas J. van Vliet, K. T. Hjel...
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