Sciweavers

78
Voted
ICCD
2004
IEEE
113views Hardware» more  ICCD 2004»
15 years 5 months ago
Functional Illinois Scan Design at RTL
This paper shows that by creating functional scan chains at the register-transfer level (RTL), not only the timing of the circuit can be improved, but also the test data compressi...
Ho Fai Ko, Nicola Nicolici