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100
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ICCAD
2000
IEEE
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ICCAD 2000
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Improving the Proportion of At-Speed Tests in Scan BIST
15 years 7 months ago
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www.cecs.uci.edu
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
Yu Huang, Irith Pomeranz, Sudhakar M. Reddy, Janus...
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