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100
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ITC
2003
IEEE
161
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ITC 2003
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DFFT : Design For Functional Testability
15 years 8 months ago
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www.itcprogramdev.org
Creating functional tests that work on an ATE has always been a significant challenge [1]. This paper identifies the fundamental mechanisms for functional test failures of an SOC ...
Haluk Konuk, Leon Xiao
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