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113
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ATS
2005
IEEE
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ATS 2005
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Compressing Functional Tests for Microprocessors
15 years 8 months ago
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In the past, test data volume reduction techniques have concentrated heavily on scan test data content. However, functional vectors continue to be utilized because they target uni...
Kedarnath J. Balakrishnan, Nur A. Touba, Srinivas ...
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