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96
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IAJIT
2010
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IAJIT 2010
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A Test Procedure for Boundary Scan Circuitry in PLDs and FPGAs
15 years 1 months ago
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: A test procedure for testing mainly the boundary scan cells, and testing partially the test access port controller in programmable logic devices, and field programmable gate arra...
Bashar Al-Khalifa
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