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147
Voted
DAC
2008
ACM
133
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Computer Architecture
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DAC 2008
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Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
16 years 4 months ago
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domino.watson.ibm.com
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
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