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107
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ISMVL
2007
IEEE
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ISMVL 2007
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Experimental Studies on SAT-Based ATPG for Gate Delay Faults
15 years 9 months ago
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www.informatik.uni-bremen.de
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
Stephan Eggersglüß, Daniel Tille, G&oum...
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