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    ASPDAC
    2008
    ACM
    103views Hardware» more  ASPDAC 2008»
    Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
    14 years 11 months ago
    Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
    Download  www.cecs.uci.edu
    This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructe...
    Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoy...
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