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    ASPDAC
    2008
    ACM
    103views Hardware» more  ASPDAC 2008»
    Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
    15 years 4 months ago
    Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
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    This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructe...
    Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoy...
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