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ASPDAC
2008
ACM
103views Hardware» more  ASPDAC 2008»
14 years 10 months ago
Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructe...
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoy...