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103
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DATE
2003
IEEE
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DATE 2003
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Area Fill Generation With Inherent Data Volume Reduction
15 years 8 months ago
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www.cs.virginia.edu
Control of variability and performance in the back end of the VLSI manufacturing line has become extremely difficult with the introduction of new materials such as copper and low...
Yu Chen, Andrew B. Kahng, Gabriel Robins, Alexande...
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