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118
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ITC
1998
IEEE
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ITC 1998
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Deterministic BIST with multiple scan chains
15 years 7 months ago
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www.iti.uni-stuttgart.de
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a pattern generator which stimulates all scan chains simu...
Gundolf Kiefer, Hans-Joachim Wunderlich
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